R2E-EPC |
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Radiation Stress | Component R2E Validation Levels | |
---|---|---|
Threshold | Unit | |
Total Ionizing Dose Cumulative Dose |
100..200* | [Gy] |
Displacement Damage Fluence neutrons 1MeV.eq (cumulative dose) |
1E11 | [particules/cm²] |
Single Event Effect Single Event Effect Cross Section (Statistical events) |
1E-12** if used once per unit |
[cm²] [nbevents / (nbparticles/cm²)] |
Component Validation Levels
* 100Gy is very high compared to non-tunnel installed units, but it is a bit low for tunnel installed units: in such a case, a dose spread over the full unit family installed is obtained moving / replacing units from low dose <=> high dose locations in the full LHC machine life.
* ELDRS impact can justify a higher TID limit, around 200 Gy to profit a safety margin of 3x to 4x compared to the LHC 50 Gy dose.
** This number is to be adapted (can be lower) versus component occurence in the final design unit, and should lead to a global MTBF only considering the radiation of 100 000 hours. A cross section of a component being used once in a converter type will give a probability of 1 failure / year for this component only, given 100 converters of same type are installed and receive 1E10 part./cm² in a year.
COTS components sensitivity is given by the original component design (inherent structure at the semiconductor level), but also by the foundry being used for production, and then is very hard to keep under control. A component being tested some years ago doesn't give a lot of information on the today component behaviour, since perhaps produced differently: new design or process or even in another foundry.
A Quality Plan has then to be strictly followed to minimize the risk.
R2E COTS CERN Validation Process .vsd
COTS Identification is the process which determines if a given COTS is sharing the same BATCH than another one.
COTS traceability is certainly a must, even if perhaps not mandatory in our cases.
All components are not showing the same sensitivity to radiations, and especially to the single event effect: theoritically and practically. Based on the litterature and the domain knowledge, 3 classes will be used to classify the components, with testing effort in relation to the known criticity.
SE-Classes | Single Event Impact? | |||
---|---|---|---|---|
Component S.E. Effect Failure probability & nature |
Component impact on Design Unique or multi-sources... |
S.E. Mitigation Techniques System / board design Level |
Test Methodology Default proposal |
|
Class 0: (Potentially sensitive) |
Unlikely (technology, papers, recent tests...) but should not be ignored. | Not really critical, since a lot of generic or/and different ratings components can be used (improving margin). | Simple, robust and reliable techniques can be used to limit S.E. impact. | Test at board level for SEE and TID. |
Class 1: (Potentially critical) |
Component is known to be sensitive, and has to be evaluated. | Rather critical, but still with some potential replacement options. | Simple, robust and reliable techniques can be used to limit S.E. impact, or/and safe design margin can be used. | Test at component level for SEE and TID, with ideally high-Ej proton test. |
Class 2: (Highly critical) |
Component is known to be sensitive, and has to be evaluated. | Highly critical: key component design based on. Another component implies complete or large part re-design. | Mitigation are not possible or not reliable enough, margins are low or not possible. | Test at component level for SEE and TID, with ideally high-Ej proton test, and even better, with high-Ej heavy ion test. |
Component Classification Criteria Table
R2E S.E. COTS CERN Validation Process .vsd
T.I.D.-Classes | T.I.D. Impact? | ||
---|---|---|---|
ELDRS Sensitivity | Mitigation Techniques | ||
Class 0: (non-ELDRS sensitive) |
Component not sensitive to ELDRS. | Simple, robust and reliable techniques can be used to limit T.I.D. degradation. | |
Class 1: (ELDRS sensitive) |
Potentially sensitive to ELDRS, or status unknown vs ELDRS. | Whatever ELDRS status, component is used at its limit, and degradation cannot be mitigated. |
Component Classification Criteria Table
R2E T.I.D. COTS CERN Validation Process .vsd
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