Test is basic, transistor being irradiated in PSI facility, with VCE=10V, Ic=1mA (keeping constant through tester).

• Table of Raw data Table of Raw data

  Gain @ Ic=1mA is recorded, while Ic.leakage is sampled every 10 seconds (putting Ib=0 for 1sec). In the same time, a trigger (100mV step, filter=1MHz) is recorded if transistor suddenly close, and a SET is counted if automatically and self reseted, SEL if obliged to do it manually through tester advanced feature.

  

  Irradiation Test Example Raw Data .vsd

• Gain Graph Gain Graph

  Gain is known to be reduced with Dose [Gy], but also with Displacement Damage [1MeV.eq/cm²]. Both graphs are then represented, even if none is correct. Indeed both DD and dose affects the gain, and they should be both represented in x-axis.

  
  

  Irradiation Test Example Gain vs Dose & vs Displacement Damage .vsd

• IC.Leakage Graph IC.Leakage Graph

  Ic Leakage current is known to be only affected by Displacement Damage, some previous tests showed dose has no impact up to several kGys.

  

  Irradiation Test Example Ic.Leakage vs Displacement Damage .vsd

• SET & SEL Graph SET & SEL Graph

  SET and SEL were recorded during the irradiation test.

  

  Irradiation Test Example SET and SEL graph .vsd

Some Single Event tests have to be computed and displayed in one graph for component characterization. It is the case of LET typical curve, where several tests done at different beam with different LET allow to trace a curve of sensitivity of the device vs LET.
The tests are then done ideally on same component batch, on different units or on same unit, being retested several times, resulting dose of each test being considered as low vs the impact on the Single Event test.

• Unique sample LET Data Extraction Unique sample LET Data Extraction

  All results of different LET tests are done on same sample.

  

  Unique sample LET Data extraction & visualization .vsd

• Multi sample of same Batch LET Data Extraction Multi sample of same Batch LET Data Extraction

  Results of different LET tests are extracted from different samples, all coming from same batch.

  

  Multiple sample LET Data extraction & visualization .vsd