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tag Design & Operation Responsibles
tag Equipment Use /Goal
tag Equipment Architecture
tag Equipment Usage
tag Production Contract & Contact History

topDesign & Operation Responsibles

Overview Picture
Responsibles: Louis DE MALLAC Louis DE MALLAC
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topEquipment Use / Goal

This tester intends to test analog components being used in R2E project (design of Radiation Tolerant Power Converters). The analog components, being tested "on-line", then under high radiation field are

  • "switch" types, like thyristors, transistors: IGBT, Mosfet, bipolar, or even diodes.

    • Simplified Schematic

  • Comparator and Operational Amplifiers

    • Simplified Schematic

R2E-EPC-Analog-On-line-Tester Component Family .vsd

topEquipment Architecture

Tester is divided in 3 parts:

    Simplified Schematic

    R2E-EPC-Analog-Tester simplified Architecture / Topology .vsd

  • R2E-EPC-Analog-On-Line-Tester-Head Module:
    • Located in the irradiated area, and containing the devices (component) under test.

  • R2E-EPC-Analog-On-Line-Tester-Control chassis:
    • Located ideally in a relative radiation safe area. Nevertheless, this chassis is designed to be relatively rad-tolerant (to be defined), in case it has to be installed close to the equipment under test.
    • This device control the test sequence, generating stimulus and reading all avalaible measurements from the heads sensors / voltage taps.

  • A Standard computer laptop:
    • Located in a radiation safe area.
    • High-Level Software.

topEquipment Usage

Some example of possible uses of the tester are described below. The 3 heads can be used for testing different datecode of a component (same REF), when it is also possible to test different references on the same kind of tests (S.E.), or even to mix different test configuration, and in very unlikely cases, mixing test configuration + component references.

Type Test Comments
Goal of the experiment and results expected. Test Conditions, limits of interest.
S.E. Determine the cross section (trying not to really crash the component under test liming when possible the event energy inside it) of the component, approching as much as possible the limits (auto-step-back when touching it). Even if nominal operation conditions are below the maximum ratings of the component, it is always required to find the effective limit of operation of the component in this test.
Treshold.Monitor Determine the effect of the cumulative dose (displacement damage + ionizing dose) on the conducting treshold of the component. A current loop based on the component current ouput control the gate voltage or base current to determine its evolution. If nominal conditions are always used for this test, some margin are considered, always trying to find the most degrading conditions for the parameters considered.
I.Leakage.Monitor Determine the effect of the cumulative dose, but also some degradation of S.E type like S.E.G.D. for Mosfets. Even if nominal operation conditions are below the maximum ratings of the component, it is always required to find the effective limit of operation of the component in this test.

topProduction Contract & Contact History

Developped LPC icon CERN SY-EPC-LPC
Manufactured CERN
Production xx Pc

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