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R2E / R2E-EPC-Analog-Off-Line-Tester |
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CERN
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SY-EPC
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| Responsibles: |
Louis DE MALLAC
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new comer
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CERN SY-EPC-LPC
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Equipment Use / Goal
This tester represents more a collection of different cards being used to test some difficult to measure characteristics. The measurement is done before irradiation and after, not during test under test phase.
Characteristics degradation type is first studied, to allow a "off-line" only test. The degradation is Total Ionizing Dose, or Displacement Damage type.
Even in the case of an Off-Line type test, it is nevertheless possible to get some curves-type results, stressing differently some batches of equipements under tests.
The question of getting the device under test under powering conditions is treated prior to this type of test / characterization.
Equipment Usage
Some example of possible uses of the tester are described below. The 3 heads can be used for testing different datecode of a component (same REF), when it is also possible to test different references on the same kind of tests (S.E.), or even to mix different test configuration, and in very unlikely cases, mixing test configuration + component references.
| Type Test | Comments | ||
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| Goal of the experiment and results expected. | Test Conditions, limits of interest. | ||
| S.E. | Determine the cross section (trying not to really crash the component under test liming when possible the event energy inside it) of the component, approching as much as possible the limits (auto-step-back when touching it). | Even if nominal operation conditions are below the maximum ratings of the component, it is always required to find the effective limit of operation of the component in this test. | |
| Treshold.Monitor | Determine the effect of the cumulative dose (displacement damage + ionizing dose) on the conducting treshold of the component. A current loop based on the component current ouput control the gate voltage or base current to determine its evolution. | If nominal conditions are always used for this test, some margin are considered, always trying to find the most degrading conditions for the parameters considered. | |
| I.Leakage.Monitor | Determine the effect of the cumulative dose, but also some degradation of S.E type like S.E.G.D. for Mosfets. | Even if nominal operation conditions are below the maximum ratings of the component, it is always required to find the effective limit of operation of the component in this test. | |
Production Contract & Contact History
| Developped |
CERN SY-EPC-LPC
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| Manufactured | CERN |
| Production | xx Pc |
| TOP | CHARTE | HTML | CSS | Ver : 18-12-2020 21:27:17 | Webmaster : Michel GEORGES. |