It appears that almost all our electronic systems used at CERN use and rely on what is commonly named: auxiliary power supply. Reliability of such equipment impacted directly the whole system reliability (except redundant system, where the reliability will more impact the turnover effort to replace faulty units).

SY-EPC propose the creation of a service to TE (CERN) members to test and validate low power supplies (<200W).
Work includes advices, testing, burnin, help on issues...with adequate power soaks capacity (up to 100 units at the same time) in order to be able to validate MTBF of up to 100 000 hours.
More info in this FAQ below:
Why can't i do it myself? Why can't i do it myself? Does it cost me something? Does it cost me something? How much time for a final report? How much time for a final report? Queues and Priorities? Queues and Priorities? When will it be operationnal? When will it be operationnal? Can i access result data? Can i access result data? MTBF of 100 000 hours? MTBF of 100 000 hours?

Range of interest is defined below:

Pout	Vout	Iout	Vin	Multi-Output
< 200 Watts	[0..48 VDC]	< 50 A	1..3ph x 230 Vac	4 outputsMax

Range

We can offer 2 types of services:

Type	Description	Comment
Type Test	A Type Test requires to invest time, opening unit, and to deeply test under stressed conditions all the electrical features. This test can completly disqualify a given unit, or reveal some non-fonctionning area.	This step will produce a good overview of the design quality and assembly competences of the manufacturer.
Reception Test	Reception tests are required when receiving the ordered batchs of units, and are based on 8hours.. several days to validate unit is safe enough. They can be on quite large quantities (up to several hundreds), with extended burnin (room temperature) capacities.	Unit doesn't need to be first evaluated by our service before entering this -in our mind- required phase. This step will also produce initial measurements for future comparative checks.

Type of activity

Detailled actions / services can be found below:

Domain	Field	Typical Measurements & Checks
EMC	Compatibility	Conductive Noise, Input and Output side.
	Susceptibility	Burst Test, Input and Output side.
Electrical	Performances	Efficiency, Output Ripple, Bandwidth...
	Input Line Variations	AC phase loss, Over-Voltage variations, Inrush current...
	Output Load Variations	Dynamic Response to sudden (0..100%, 50..100%) load variation.
Fabrication Quality	Process	Solder process viability, PCB Layout, Component placement...
Design	Topology	Partial overview of pro / cons of topology being studied.
	Components	Components choice (technology, ratings...), depending on documentation (schematics) available.
Reliability And Advanced Testing	Infra-Red Inspection	A systematic Infra-Red inspection under various operating conditions is performed, depending on unit design.
	Accelerated Testing	In case some units can be sacrified, some tests can be done to evaluate the reliability (lifetime, MTBF of the unit).

Activities

Test area is located in Bat 287 RDC floor (Meyrin): 287 R-004.